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APPAREIL DE DIAGNOSTIC À RAYONS X ET PROGRAMME DE DIAGNOSTIC À RAYONS X
专利权人:
SHIMADZU CORPORATION
发明人:
HASEGAWA, NAOKI
申请号:
EP11864008
公开号:
EP2700359A4
申请日:
2011.04.22
申请国别(地区):
EP
年份:
2014
代理人:
摘要:
An X-ray diagnostic apparatus includes a peak frequency detector detecting a peak frequency of a first harmonic in a moiré pattern of a grid appearing in an image; a first and second harmonic remover removing the first harmonic and a second harmonic in the moiré pattern from the image in accordance with the peak frequency of the first harmonic to obtain a first and second harmonic removed image; a third harmonic extracting-filter generating unit calculating a peak frequency of a third harmonic in the moiré pattern in accordance with the peak frequency of the first harmonic to generate a third harmonic extracting filter to extract the third harmonic; a third harmonic extracting unit extracting the third harmonic from the first and second harmonic removed image based on the third harmonic extracting filter and a third harmonic subtracting unit subtracting the extracted third harmonic from the first and second harmonic removed image to obtain a third harmonic removed image.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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