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Temperature drift correction for multi-slice detector in computed tomography
专利权人:
Abdelaziz Ikhlef
发明人:
Abdelaziz Ikhlef,Joseph James Lacey
申请号:
US13004300
公开号:
US08757878B2
申请日:
2011.01.11
申请国别(地区):
US
年份:
2014
代理人:
摘要:
A system and method for temperature drift correction capability in a CT detector module is disclosed. A scintillator array of a CT detector module has a plurality of scintillator cells configured to detect high frequency electromagnetic energy passing through an object, with a plurality of photodiodes in a photodiode array optically coupled to the scintillator array to detect light output therefrom. A computer is provided that is programmed to measure a response of the plurality of photodiodes as a function of temperature, determine a transfer function indicative of the response of the plurality of photodiodes as a function of temperature, normalize the transfer function to a virtual operating temperature, measure a temperature of the photodiode array prior to a scan, determine a correction factor from the normalized transfer function based on the measured photodiode temperature and the virtual operating temperature, and apply the correction factor to the photodiode outputs.
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