HUANG, Hao,YAO, Yu,DEWEY, C. Forbes,BAWENDI, Moungi G.
申请号：
EP08865911
公开号：
EP2193468A4
申请日:
2008.09.26
申请国别(地区):
EP
年份:
2017
代理人:
摘要：
A method of imaging microscopic objects includes determining the relative depths of two or more semiconductor nanocrystals by analyzing images of the semiconductor nanocrystals at varying z-displacements.
