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Systems and Methods for Visualizing the Interior Morphology and Material Properties of Samples from Surface Deformations
专利权人:
发明人:
Sevan Goenezen,Yei Mei
申请号:
US15771727
公开号:
US20180306691A1
申请日:
2016.11.18
申请国别(地区):
US
年份:
2018
代理人:
摘要:
Systems and methods disclosed herein enable the characterization of material property distribution across a sample to ensure sample consistency and/or to detect and characterize anomalies including tumors, inclusions, cracks, changes in structural stiffness in samples capable to experience deformation. The boundary displacement data is collected using a plurality of induced deformations at a plurality of angles and locations relative to surfaces/boundaries of the sample, and the data is transformed to determine material properties of the sample using numerical techniques and material modeling.
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