This subjective eye examination device for subjectively measuring an optical characteristic of a subject eye is provided with: a projection optical system which includes an optotype presenting unit and an optical member, projects the optotype light flux toward the subject eye, and causes optotype light flux emitted from the optotype presenting unit to be incident while shifted with respect to an optical axis of the optical member； a housing accommodating the projection optical system； a presenting window for emitting the optotype light flux from the inside of the housing toward the outside thereof； an ocular refractive power measuring unit which is provided outside the housing； and a holding means for integrally coupling the housing to the ocular refractive power measuring unit and holding the ocular refractive power measuring unit； wherein, when using the ocular refractive power measuring unit, a first distance from the presenting window to the ocular refractive power measuring unit on an optical path along which the optotype light flux from the optotype presenting unit is projected into the subject eye is at most equal to 180 mm.
