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YIELD MONITORING APPARATUS, SYSTEMS, AND METHODS
专利权人:
Precision Planting LLC
发明人:
Michael Strnad,Justin Koch
申请号:
US16866819
公开号:
US20200264025A1
申请日:
2020.05.05
申请国别(地区):
US
年份:
2020
代理人:
摘要:
A method of calibrating a yield sensor of a harvesting machine. The yield sensor generates a grain force signal as clean grain piles are thrown by the elevator flights against the sensor surface of the yield sensor. A grain height sensor is disposed to detect a height of the clean grain pile on each passing elevator flight. Each grain height signal is associated with a corresponding grain force signal by applying a time shift to account for a time delay between the time the grain height signal is generated and the time at which the impact signal is generated. The grain force signal is corrected by multiplying the grain force signal by a correction factor. The correction factor is the sum of the grain height signals divided by the sum of the grain force signals over a predetermined period.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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