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Calibrating in Single Photon Emission Computed Tomography with Multi-Emission Energies
专利权人:
发明人:
Manojeet Bhattacharya
申请号:
US15315151
公开号:
US20170192104A1
申请日:
2015.06.12
申请国别(地区):
US
年份:
2017
代理人:
摘要:
For calibration (24) for quantitative SPECT, a multiple energy emission source (11) is used for calibration. The planar sensitivities and/or uniformities are determined at different emission energies based on detections from the multiple energy emission source. For estimating (32) the activity concentration, sensitivities and/or uniformities based on measures (26) at different emission energies increase accuracy. The multiple energy emission source (11) may alternatively or additionally be used to calibrate (40) a dose calibrator (15).
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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manojeet bhattacharya
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