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Test probes for smart inspection
专利权人:
Fluke Corporation
发明人:
Schell J. David,Schillab Christian
申请号:
US201514882304
公开号:
US10090914(B2)
申请日:
2015.10.13
申请国别(地区):
美国
年份:
2018
代理人:
Seed IP Law Group LLP
摘要:
One or more embodiments are directed to apparatuses and methods of evaluating an endface of an optical communication link, such as a fiber optic cable. In at least one embodiment, a camera probe includes an imaging device that includes one or more feedback mechanisms, such as an alignment feedback mechanism that communicates alignment information regarding an alignment of the optical communication link under test with an image sensor of the camera probe. The alignment feedback mechanism may be visual and/or aural. The alignment feedback mechanism may provide directional information to the user indicative of a direction to move the imaging device relative to the optical communication link. In addition or alternatively, the feedback mechanism may include a focus feedback mechanism that communicates focus information regarding a focus of the endface in an obtained image of the endface.
来源网站:
中国工程科技知识中心
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http://www.ckcest.cn/home/

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