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System and method for detection of materials using orbital angular momentum signatures
专利权人:
NxGen Partners IP; LLC
发明人:
Solyman Ashrafi,Roger D. Linquist
申请号:
US15677552
公开号:
US10048202B2
申请日:
2017.08.15
申请国别(地区):
US
年份:
2018
代理人:
摘要:
An apparatus for identifying a material within a sample comprising signal generation circuitry generates a first signal including a first orbital angular momentum (OAM) signature and applies the first signal to the sample. A detector receives the first signal after the first signal passes through the sample and identifies the material within the sample based on a detected second orbital angular momentum caused by an interaction of the first signal with chiral molecules within the sample.
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