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Apparatus and method for measuring ion beam current
专利权人:
Peter M Kopalidis
发明人:
Peter M Kopalidis,Zhimin Wan
申请号:
US12841833
公开号:
US08653807B2
申请日:
2010.07.22
申请国别(地区):
US
年份:
2014
代理人:
摘要:
Techniques for ion beam current measurement, especially for measuring low energy ion beam current, are disclosed. In one exemplary embodiment, the techniques may be realized as an ion beam current measurement apparatus has at least a planar Faraday cup and a magnet device. The planar Faraday cup is close to an inner surface of a chamber wall, and may be non-parallel to or parallel to the inner surface. The magnet device is located close to the planar Faraday cup. Therefore, by properly adjusting the magnetic field, secondary electrons, incoming electrons and low energy ions may be adequately suppressed. Further, the planar Faraday cup may surround an opening of an additional Faraday cup being any conventional Faraday cup. Therefore, the whole ion beam may be received and measured well by the larger cross-section area of at least the planar Faraday cup on the ion beam path.
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来源网址:
http://www.ckcest.cn/home/
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