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Crystalline forms of grapiprant
专利权人:
Aratana Therapeutics Inc.
发明人:
NEWBOLD, Tamara,SMITH, Melissa,SEEKAMP, Chris,WENSLOW, Robert,LU, Xia
申请号:
ES15758500
公开号:
ES2755396T3
申请日:
2015.03.05
申请国别(地区):
ES
年份:
2020
代理人:
摘要:
A grapiprant crystal having crystalline Form X, exhibiting a powder X-ray diffraction pattern comprising characteristic peaks expressed in degrees 2-theta at 6.5 ± 0.15, 10.1 ± 0.15, 14 , 9 ± 0.15, 15.3 ± 0.15, 19.7 ± 0.15, 20.3 ± 0.15, 21.3 ± 0.15, 22.7 ± 0.15, 23.1 ± 0.15 and 27.3 ± 0.15; and exhibiting a differential scanning calorimetry profile having endotherm / exotherm episodes at approximately 33-80 ° C and at approximately 110-140 ° C; and that exhibits a thermogravimetric analysis that shows a mass loss of 12-13%, when heated from 24 ºC to 150 ºC; wherein the X-ray diffraction pattern is determined using an X-ray diffractometer with a Kα copper diffraction source operated at 45 kV / 40 mA, a sweep range of 3.0 to 40.0 degrees 2- theta, a stage size of 0.02 degrees 2-theta, and a sweep time of 12.7 seconds per stage; and wherein the differential scanning calorimetry profile is performed using a heated differential scanning calorimeter of 22 ° C at the designated temperature at a rate of 5 ° C per minute; and in which the thermogravimetric analysis was carried out with a thermogravimetric analyzer heated from room temperature to a designated temperature at a rate of 10 ° C per minute with nitrogen flow of 50 ml per minute.Un cristal de grapiprant que tiene la Forma X cristalina, que exhibe un patrón de difracción de rayos X en polvo que comprende picos característicos expresados en grados 2-theta a 6,5 ± 0,15, 10,1 ± 0,15, 14,9 ± 0,15, 15,3 ± 0,15, 19,7 ± 0,15, 20,3 ± 0,15, 21,3 ± 0,15, 22,7 ± 0,15, 23,1 ± 0,15 y 27,3 ± 0,15; y que exhibe un perfil de calorimetría de barrido diferencial que tiene episodios de endoterma/exoterma a aproximadamente 33-80 ºC y a aproximadamente 110-140 ºC; y que exhibe un análisis termogravimétrico que muestra una pérdida de masa de un 12-13 %, cuando se calienta de 24 ºC a 150 ºC; en el que el patrón de difracción de rayos-X se determina usando un difractómetro de rayos-X con fuente de difracción de cobre Kα operada a 45 kV/40
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