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Ultrasonic-Wave Probe, Ultrasonic-Wave Diagnosis Apparatus, and Test Method of Ultrasonic-Wave Probe
专利权人:
Ltd.;Hitachi
发明人:
Shinya KAJIYAMA,Yutaka IGARASHI,Yusaku KATSUBE,Takuma NISHIMOTO
申请号:
US15553197
公开号:
US20180035974A1
申请日:
2016.02.25
申请国别(地区):
US
年份:
2018
代理人:
摘要:
A test for screening defects of a transmission/reception circuit in an IC is enabled at low cost, without withstand voltage violation, and without carrying out electrical contacts with many terminals connected to oscillators. In a transmission/reception separation switch circuit using transistors as switch elements, a potential of a gate is lowered in a test more than the potential in a case of reception to avoid gate-source withstand-voltage violation when a large-amplitude signal is input, and an internal-signal loopback test is carried out without destroying a reception circuit.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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