您的位置: 首页 > 农业专利 > 详情页

Eyeglass device parameter measurement imaging device
专利权人:
株式会社ニデック
发明人:
小林 俊洋,栃久保 裕司郎,尾崎 賀洋
申请号:
JP2013270586
公开号:
JP6357771B2
申请日:
2013.12.26
申请国别(地区):
JP
年份:
2018
代理人:
摘要:
PROBLEM TO BE SOLVED: To enable more proper measurement by creating a far vision state and a near vision state of a subject.SOLUTION: An imaging apparatus for spectacle parameter measurement of capturing an image for measuring a parameter for spectacle wearing, includes: a first measuring optical system which is provided with a fixation target for far vision of making a subject fixedly view in the far vision state and a first imaging element of imaging the subject set in the far vision state with the fixation target for far vision, guides the fixation target for far vision from the front surface direction to eyes to be inspected, and guides light from the subject to the first imaging element; and a second measuring optical system which is provided with a fixation target for near vision of making the subject fixedly view in the near vision state and a second imaging element of imaging the subject set in the near vision state with the fixation target for near vision independently of the fixation target for far vision and the first imaging element, guides the fixation target for near vision to the eyes to be inspected and guides light from the subject to the second imaging element. The first measuring optical system and the second measuring optical system are arranged independently of each other.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充