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Method of locating valid light spots for optical measurement and optical measurement instrument employing method of locating valid light spots
专利权人:
Stephen W. Farrer
发明人:
Stephen W. Farrer,Thomas D. Raymond,Wei Xiong,John Dixson,Daniel R. Neal
申请号:
US13156013
公开号:
US08622546B2
申请日:
2011.06.08
申请国别(地区):
US
年份:
2014
代理人:
摘要:
An algorithm locates valid light spots produced on an image detector by a wavefront of interest. The algorithm includes sequentially examining pixels of the image detector to determine for each of the pixels whether the light intensity detected by the pixel is greater than a threshold, When the pixels detected light intensity is determined to be greater than the threshold, the algorithm includes: determining whether the pixel belongs to a valid light spot and when the pixel is determined to belong to a valid light spot saving data indicating a location for the valid light spot and masking out a group of pixels of the image detector at the determined location such that the masked pixels are considered to have a light intensity less than the threshold for a remainder of the sequential examination.
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中国工程科技知识中心
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http://www.ckcest.cn/home/

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