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APPARATUS AND METHOD FOR MEASURING ELECTRICAL CHARACTERISTIC USING NUCLEAR MAGNETIC RESONANCE
专利权人:
Hitachi; Ltd.
发明人:
Yukio KANEKO,Hisaaki OCHI,Yoshihisa SOUTOME
申请号:
US15701640
公开号:
US20180085026A1
申请日:
2017.09.12
申请国别(地区):
US
年份:
2018
代理人:
摘要:
When an electrical characteristic of a predetermined region of a subject placed in a static magnetic field space is measured by using magnetic resonance signals measured from the region, measurement data measured by coinciding direction of a tissue structure of the subject with the direction of the static magnetic field, and measurement data measured with a direction of the tissue structure of the subject crossing the direction of the static magnetic field are used. A rotating magnetic field map of the region is created from the measurement data, and the electrical characteristic is calculated by using the rotating magnetic field map. The electrical characteristic is calculated as an electrical characteristic including anisotropy by using information about the direction of tissue structure. According to the present invention, electrical characteristic such as electrical conductivity including anisotropy can be measured with good precision with an electrical characteristic measuring apparatus using nuclear magnetic resonance.
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中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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