PROBLEM TO BE SOLVED: To provide a particle beam treatment system capable of performing highly accurate dose control, while reducing increment of an exposure time.SOLUTION: A beam is allowed to scan while emission control of a charged particle beam is executed by a charged particle beam generator 1 to a region to be scanned by one-time scanning control, and in addition, during a period in which emission is continued after emission control stop.SELECTED DRAWING: Figure 5COPYRIGHT: (C)2017,JPO&INPIT【課題】照射時間の増加量を削減しつつ、高精度の線量管理が可能な粒子線治療システムを提供する。【解決手段】一回の走査制御によって走査すべき領域に対して、荷電粒子ビーム発生装置1が荷電粒子ビームの出射制御を実行している間に加えて、出射制御停止後に出射が継続される期間もビームを走査する。【選択図】図5
