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Eye examination template
专利权人:
Don C. Bagwell; Sr.
发明人:
Don C. Bagwell, Sr.
申请号:
US15079182
公开号:
US09706917B1
申请日:
2016.03.24
申请国别(地区):
US
年份:
2017
代理人:
摘要:
An eye examination template for measuring an optic disc can include an x-axis measurement line, a y-axis measurement line, and an optic disc oval. In one aspect, the x-axis measurement line can include a plurality of x-axis measurement marks. In another aspect, the y-axis measurement line can include a plurality of y-axis measurement marks. In yet another aspect, the y-axis measurement line can intersect the x-axis measurement line at a square angle intersection. In a further aspect, the optic disc oval can be centered on the intersection of the y-axis measurement line with the x-axis measurement line. In one aspect, the optic disc oval can correspond with an average optic disc size of a first demographic of a population.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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