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ENHANCED SPECTRAL X-RAY IMAGING
专利权人:
Prismatic Sensors AB
发明人:
Hans BORNEFALK,Fredrik GRÖNBERG,Mats DANIELSSON
申请号:
US16705785
公开号:
US20200261041A1
申请日:
2019.12.06
申请国别(地区):
US
年份:
2020
代理人:
摘要:
An x-ray imaging apparatus includes an x-ray source and detector with multiple detector elements. The source and detector are on a support that rotates around a subject, enabling projections at different view angles. The apparatus operates the x-ray source in switched kVp mode for alternately applying different voltages, including lower and higher voltages, during rotation to enable lower-energy and higher-energy exposures over the projections, providing for lower-energy projections and higher-energy projections. The x-ray detector is a photon-counting multi-bin detector allocating photon counts to multiple energy bins, and the apparatus selects counts from at least a subset of the bins to provide corresponding photon count information for both lower- and higher-energy projections. The apparatus performs material basis decomposition for some of the lower-energy projections and higher-energy projections and/or for some combinations of at least one lower-energy projection and at least one higher-energy projection, based on the corresponding photon count information.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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