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SYSTEMS AND METHODS FOR ELECTROSTATIC TRAPPING OF CONTAMINANTS IN CRYOGENIC REFRIGERATION SYSTEMS
专利权人:
D-Wave Systems Inc.
发明人:
Uchaykin Sergey
申请号:
US201515502165
公开号:
US2017227267(A1)
申请日:
2015.08.05
申请国别(地区):
美国
年份:
2017
代理人:
摘要:
Systems and methods for improving the performance of dilution refrigeration systems are described. Electrostatic cryogenic cold traps employed in the helium circuit of a dilution refrigerator improve the removal efficiency of contaminants from the helium circuit. An ionization source ionizes at least a portion of a refrigerant that includes helium and number of contaminants. The ionized refrigerant passes through an electrostatic cryogenic cold trap that includes a number of surfaces at one or more temperatures along at least a portion of the fluid passage between the cold trap inlet and the cold trap outlet. A high voltage source coupled to the surfaces to causes a first plurality of surfaces to function as electrodes at a first potential and a second plurality of surfaces to function as electrodes at a second potential. As ionized contaminants release their charge on the electrodes, the contaminants bond to the electrodes.
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中国工程科技知识中心
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