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METHOD AND SYSTEM FOR AUTOMATED DETECTION AND MEASUREMENT OF A TARGET STRUCTURE
专利权人:
General Electric Company
发明人:
Jixu Chen,Kajoli Banerjee Krishnan
申请号:
US14489497
公开号:
US20160081663A1
申请日:
2014.09.18
申请国别(地区):
US
年份:
2016
代理人:
摘要:
A system and method for imaging a subject are disclosed. A plurality of edge points corresponding to a set of candidate structures are determined in each image frame in a plurality of 3D image frames corresponding to a volume in the subject. A target structure is detected from the set of candidate structures by applying constrained shape fitting to the edge points in each image frame. A subgroup of image frames including the target structure is identified from the 3D frames. A subset of edge points corresponding to the target structure is determined in each of the subgroup of image frames. A plurality of 2D scan planes corresponding to the subset of edge points is determined, and ranked using a determined ranking function to identify a desired scan plane. A diagnostic parameter corresponding to the target structure is measured using a selected image frame that includes the desired scan plane.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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