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Devices and Methods for Measurement and Correction of High-Order Optical Aberrations for an Eye Wearing a Contact Lens
专利权人:
Ovitz Corporation
发明人:
Joung Yoon KIM,Nicolas Scott BROWN
申请号:
US16558298
公开号:
US20200069177A1
申请日:
2019.09.02
申请国别(地区):
US
年份:
2020
代理人:
摘要:
Devices and methods for measuring high order aberrations from an eye are described. A method includes obtaining information indicating one or more aberrations of an eye, and obtaining information indicating one or more of a visual axis of the eye, a center of a pupil of the eye, and a corneal vertex of the eye. The information from the optical device is used to modify a design of a contact lens so that a combination of the eye and the modified contact lens has reduced high order aberrations. In some cases, information indicating the orientation of the contact lens positioned on the eye is also used. The optical device may include an aberrometer; a first light source for providing first light toward an eye; a lens assembly for collecting light from the eye; and a first image sensor for receiving light that has been transmitted through the lens assembly.
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中国工程科技知识中心
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http://www.ckcest.cn/home/

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