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Device and Method for Analyzing a Material
专利权人:
DiaMonTech GmbH
发明人:
Alexander BAUER,Otto HERTZBERG,Thorsten LUBINSKI
申请号:
US15776544
公开号:
US20180328835A1
申请日:
2016.12.07
申请国别(地区):
US
年份:
2018
代理人:
摘要:
The invention relates, inter alia, to a device (10) for analysing a material (101), comprising an excitation emission device (100) for generating at least one electromagnetic excitation beam (SA), particularly an excitation light beam, with at least one excitation wavelength, and further comprising a detection device (106) for detecting a reaction signal (SR), and a device (107) for analysing the material on the basis of the detected reaction signal (SR).
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