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Integrated optical nanoscale probe
专利权人:
Infinitum Solutions, Inc.
发明人:
Heidmann Juergen
申请号:
US201715655785
公开号:
US9978407(B2)
申请日:
2017.07.20
申请国别(地区):
美国
年份:
2018
代理人:
Silicon Valley Patent Group LLP
摘要:
A diamond probe is suitable to be attached to an Atomic Force Microscope and is created with a tip that incorporates a one or more Nitrogen Vacancy (NV) centers located near the end of the tip. The probe arm acts as an optical waveguide to propagate the emission from the NV center with high efficiency and a beveled end directs excitation light to the NV center and directs photoluminescence light emanating from the NV center into the probe arm. The light source (or a portion of the light source), a detector, as well as an RF antenna, if used, may be mounted to the probe arm. The probe with integrated components enable excitation of photoluminescence in the NV center as well as optically detected Electron Spin Resonance (ODMR) and temperature measurements, and may further serve as a light probe utilizing the physical effect of Stimulated Emission Depletion (STED).
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