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Artefact for evaluating the performance of an X-ray computed tomography system
专利权人:
Nikon Metrology NV
发明人:
Daniel Hilton,Diego Alfredo Punin Albarracin
申请号:
US14759500
公开号:
US10463339B2
申请日:
2014.02.06
申请国别(地区):
US
年份:
2019
代理人:
摘要:
The invention provides a kit for assembly of an artifact for evaluating performance purposes of an X-ray CT metrology system. The artifact comprises one or more interconnectable, stackable support plates, onto which a plurality of spherical bodies is mounted. The lightweight stacked support plate structure allows for a plurality of different configurations, and can be disassembled for enhanced storage, and safe and compact transportation.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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