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Methods and systems for pattern characteristic detection
专利权人:
The Trustees of Columbia University in the City of New York
发明人:
Alan Chad DeChant,Hod Lipson,Rebecca J. Nelson,Michael A. Gore,Tyr Wiesner-Hanks,Ethan Stewart,Jason Yosinski,Siyuan Chen
申请号:
US16161499
公开号:
US10747999B2
申请日:
2018.10.16
申请国别(地区):
US
年份:
2020
代理人:
摘要:
Disclosed are devices, systems, apparatus, methods, products, and other implementations, including a method to detect pattern characteristics in target specimens that includes acquiring sensor data for the target specimens, dividing the acquired sensor data into a plurality of data segments, and generating, by multiple neural networks that each receives the plurality of data segments, multiple respective output matrices, with each data element of the multiple respective output matrices being representative of a probability that corresponding sensor data of a respective one of the plurality of data segments includes a pattern characteristic in the target specimens. The method further includes determining by another neural network, based on the multiple respective output matrices generated by the multiple neural networks, a presence of the pattern characteristic in the target specimens.
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