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Methods and apparatus for detecting and localizing partial conductor failures of implantable device leads
专利权人:
Lambda Nu Technology LLC
发明人:
Mark W. Kroll,Charles D. Swerdlow
申请号:
US14224281
公开号:
US10039919B2
申请日:
2014.03.25
申请国别(地区):
US
年份:
2018
代理人:
摘要:
Method and apparatus for diagnosis of conductor anomalies, such as partial conductor failures, in an implantable lead for an implantable medical device are disclosed. In various embodiments, small changes in the lead impedance are identified by the use of a small circuit element that is incorporated as part of the distal end of the implantable lead. In various embodiments, the small circuit element is electrically connected to a lead conductor and/or electrode of the implantable lead. Methods of diagnosing conductor anomalies in accordance with these embodiments generate measured values that depend only on the impedance of the conductors and electrodes of the lead, and not on the behavior of the conductor-tissue interface and other body tissues.
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