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Differential phase contrast imaging using a focusing deflection structure plate
专利权人:
コーニンクレッカ フィリップス エヌ ヴェ
发明人:
レッスル,エヴァルト,ケーラー,トーマス,レッスル,エヴァルト,ケーラー,トーマス
申请号:
JP2016023849
公开号:
JP6225201B2
申请日:
2016.02.10
申请国别(地区):
JP
年份:
2017
代理人:
摘要:
The present invention relates to X-ray differential phase-contrast imaging, in particular to a deflection device for X-ray differential phase-contrast imaging. In order to provide differential phase-contrast imaging with improved dose efficiency, a deflection device (28) for X-ray differential phase-contrast imaging is provided, comprising a deflection structure (41) with a first plurality (44) of first areas (46), and a second plurality (48) of second areas (50). The first areas are provided to change the phase and/or amplitude of an X-ray radiation; and wherein the second areas are X-ray transparent. The first and second areas are arranged periodically such that, in the cross section, the deflection structure is provided with a profile arranged such that the second areas are provided in form of groove-like recesses (54) formed between first areas provided as projections (56). The adjacent projections form respective side surfaces (58) partly enclosing the respective recess arranged in between. The side surfaces of each recess have a varying distance (60) across the depth (62) of the recess.
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中国工程科技知识中心
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