您的位置: 首页 > 农业专利 > 详情页

SCANNING AN OBJECT IN THREE DIMENSIONS USING COLOR DASHED LINE PATTERN
专利权人:
VATECH Co., Ltd.;VATECH EWOO Holdings Co., Ltd.
发明人:
Sung Il CHOI
申请号:
US16523445
公开号:
US20190349570A1
申请日:
2019.07.26
申请国别(地区):
US
年份:
2019
代理人:
摘要:
The disclosure is related to a method and apparatus of scanning a target object in three dimensions (3D). The method may include projecting a color dashed line pattern onto a target object, scanning the target object with the color dashed line pattern projected thereto, and producing a 3D data of the target object by processing the scanning result. The color dashed line pattern may include multiple dashed line patterns each of which is individually used to calculate the 3D data of the target object.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
相关发明人
相关专利

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充