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Probe device
专利权人:
Atsushi Ninomiya
发明人:
Atsushi Ninomiya,Yoshimi Kasai,Yukiko Hirabayashi
申请号:
US11940341
公开号:
US08244326B2
申请日:
2007.11.15
申请国别(地区):
US
年份:
2012
代理人:
摘要:
A probe device for optically measuring a condition of an object includes a light emitter for emitting a light to proceed into the object through a surface of the object, a light sensor for measuring an optical condition of the light proceeding from the surface through the object and subsequently emitted from the surface to reach the light sensor, and a body holding thereon at least one of the light emitter and the light sensor. The body includes at least one main protrusion protruding so as to face to the surface, and at least two sub-protrusions arranged around the at least one main protrusion and protruding so as to face to the surface.
来源网站:
中国工程科技知识中心
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