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METHOD AND APPARATUS FOR IMPROVING SCATTER ESTIMATION AND CORRECTION IN IMAGING
专利权人:
Inc.;Accuray
发明人:
Daniel Gagnon,Chuanyong Bai,Zhicong Yu,Amit Jain,Calvin R. Maurer, JR.
申请号:
US16694218
公开号:
US20200170601A1
申请日:
2019.11.25
申请国别(地区):
US
年份:
2020
代理人:
摘要:
An x-ray imaging apparatus and associated methods are provided to receive measured projection data from a wide aperture scan of a wide axial region and a narrow aperture scan of a narrow axial region within the wide axial region and determine an estimated scatter in the wide axial region using an optimized scatter estimation technique. The optimized scatter estimation technique is based on the difference between the measured scatter in the narrow axial region and the estimated scatter in the narrow axial region. Kernel-based scatter estimation/correction techniques can be fitted to minimize the scatter difference in the narrow axial region and thereafter applying the fitted (optimized) kernel-based scatter estimation/correction to the wide axial region. Optimizations can occur in the projection data domain or the reconstruction domain. Iterative processes are also utilized.
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中国工程科技知识中心
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