The intensity of an X-ray signal received at a detector after passing through an object of interest is a function of the attenuation, phase change, and scattering caused by the object of interest. In traditional X-ray systems, it was not possible to resolve these components. This application discusses an X-ray measurement technique which is insensitive to the variations in the interferometric pattern caused by phase differences in portions of the object of interest. Thus, received intensity measurements are caused only by attenuation and scattering components. By making two independent measurements of the object of interest using such a phase-invariant imager, the attenuation and scattering components may be separated, providing valuable extra information about the imaged object of interest arising from so-called “dark field” effects.
