Gabriel A. Mouchawar;Gene A. Bornzin;John W. Poore;Richard Williamson;Eric S. Fain
发明人:
Gene A. Bornzin,John W. Poore,Richard Williamson,Gabriel A. Mouchawar,Eric S. Fain
申请号：
US12498982
公开号：
US08391980B2
申请日:
2009.07.07
申请国别(地区):
US
年份:
2013
代理人:
摘要：
A method for detecting potential failures by a lead of an implantable medical device is provided. The method includes sensing a first signal over a first channel between a first combination of electrodes on the lead and sensing a second signal from a second channel between a second combination of electrodes on the lead. The method determines whether at least one of the first and second signals is representative of a potential failure in the lead and identifies a failure and the electrode associated with the failure based on which of the first and second sensed signals is representative of the potential failure. Optionally, when the first and second sensed signals are both representative of the potential failure, the method further includes determining whether the first and second sensed signals are correlated with one another. When the first and second sensed signals are correlated, the method declares an electrode common to both of the first and second combinations to be associated with the failure.
