ANALYTE METER WITH BASIC AND ADVANCED METER PRESET MODE SELECTION BASED ON STRUCTURED QUERIES
- 专利权人:
- 发明人:
- Sweta CHOVANDA,Shawn Berven
- 申请号:
- US13689446
- 公开号:
- US20140148668A1
- 申请日:
- 2012.11.29
- 申请国别(地区):
- US
- 年份:
- 2014
- 代理人:
- 摘要:
- Described are methods and systems to allow users to select a basic mode or an advanced mode in which additional features can be customized for the user based on structured queries presented to the user.
- 来源网站:
- 中国工程科技知识中心
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