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SPECTRAL CHARACTERISTIC MEASUREMENT DEVICE
专利权人:
发明人:
NATIONAL UNIVERSITY CORPORATION KAGAWA
申请号:
IN2229/CHENP/2015
公开号:
IN2015CN02229A
申请日:
2015.04.17
申请国别(地区):
IN
年份:
2016
代理人:
摘要:
This spectral characteristic measurement device is provided with: a division optical system which divides measurement light fluxes respectively emitted from a plurality of measurement points located within a measurement region of an object to be measured into a first measurement light flux and a second measurement light flux an imaging optical system which causes the first measurement light flux and the second measurement light flux to interfere with each other a light path length difference imparting means which imparts a continuous light path difference distribution between the first measurement light flux and the second measurement light flux a detection unit which detects the light intensity distribution of interference light a processing unit which on the basis of the light intensity distribution of the interference light detected by the detection unit obtains an interferogram of the measurement points of the object to be measured and acquires a spectrum by Fourier transforming the interferogram a conjugate plane imaging optical system which is disposed between the object to be measured and the division optical system and has a conjugate plane shared with the division optical system and a periodicity imparting means which is disposed in the conjugate plane and imparts periodicity between the measurement light fluxes emitted from the plurality of measurement points.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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