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測量裝置
专利权人:
ARKRAY; INC.
发明人:
NAKAGAWA, TAKASHI,中川贵司,中川貴司
申请号:
TW101121077
公开号:
TWI479151B
申请日:
2012.06.13
申请国别(地区):
TW
年份:
2015
代理人:
摘要:
In a measurement situation information storage unit (25a), a plurality of sets of measurement situation information for identifying a measurement situation in which predetermined measurement is performed on a measurement target are stored in association with time periods. A measurement processing unit (26) executes measurement on the measurement target (10). A display unit (37) selects, from among the plurality of sets of measurement situation information, a set of measurement situation information corresponding to the measurement operation timing based on the time (31) of the measurement operation timing or based on processing results obtained as a result of execution of measurement by the measurement processing unit, and causes a display (22) to show the selected set of measurement situation information in a manner distinguishable from other measurement situation information.本發明提供一種測量裝置,測量時狀態資訊儲存部(25a)係與時間帶對應地儲存用於特定對測量對象所進行既定的測量的測量時狀態的複數個測量時狀態資訊。測量處理部(26)係執行對測量對象的測量。顯示部(37)係從複數個測量時狀態資訊中,根據測量操作時機的時間、或根據由測量處理部(26)執行測量所得到的處理結果,選擇與測量操作時機對應的測量時狀態資訊,並在與其他測量時狀態資訊區別的狀態下將所選擇的測量時狀態資訊顯示在顯示器上。
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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