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Integrated diagnostic test system
专利权人:
Brent E. Modzelewski;Gary T. Neel;Cameron Scott Casterline
发明人:
Gary T. Neel,Brent E. Modzelewski,Cameron Scott Casterline
申请号:
US10857917
公开号:
US08147426B2
申请日:
2004.06.02
申请国别(地区):
US
年份:
2012
代理人:
摘要:
A system for diagnostic testing may include a meter for performing a diagnostic test on a sample applied to a test media and a container configured to contain test media compatible with the meter. The meter may include a closure portion for selectively closing the opening of the container. The system may also provide mechanisms to disable a power source, an auto-on function of the meter, a diagnostic testing function of the meter, or other function of the meter when it has been determined that a triggering event has occurred. The system may further provide mechanisms to reconfigure the meter to perform a new function when it has been determined that the triggering event has occurred.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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