Method of planning inspection of inspection object in magnetic resonance apparatus and magnetic resonance apparatus

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专利权人:

シーメンス アクチエンゲゼルシヤフト

发明人:

ヴァルター ベック,クラウス マイヤー,セシール モール,ヨッヒェン ツェルトナー

申请号：

JP2006171373

公开号：

JP5258174B2

申请日:

2006.06.21

申请国别(地区):

JP

年份:

2013

代理人:

摘要：

In a method and device for planning an examination of an examination subject in an imaging diagnosis device, a reference image is selected, and an image of the examination subject is to be made that corresponds to the reference image. A workflow protocol is determined with which the reference image was generated. The acquisition of all required images of the examination subject is planned using this workflow protocol. The workflow protocol is executed for creation of an image of the examination subject that corresponds to the reference image.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/