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Material property gauges and methods for determining a property of a material
专利权人:
Troxler Electronic Laboratories, Inc.
发明人:
Troxler Robert Ernest,Dep Wewage Hiran Linus
申请号:
US201615189659
公开号:
US10145772(B2)
申请日:
2016.06.22
申请国别(地区):
美国
年份:
2018
代理人:
Olive Law Group, PLLC
摘要:
The subject matter described herein includes methods, systems, and computer program products for measuring the density of a material. According to one aspect, a material property gauge includes a nuclear density gauge for measuring the density of a material. A radiation source adapted to emit radiation into a material and a radiation detector operable to produce a signal representing the detected radiation. A first material property calculation function may calculate a value associated with the density of the material based upon the signal produced by the radiation detector. The material property gauge includes an electromagnetic moisture property gauge that determines a moisture property of the material. An electromagnetic field generator may generate an electromagnetic field where the electromagnetic field sweeps through one or more frequencies and penetrates into the material. An electromagnetic sensor may determine a frequency response of the material to the electromagnetic field across the several freque
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