An apparatus (1) for profiling the depth of a surface of a target object (30), having a two-dimensional array of lasers (5), an optical device (15) for projecting a two-dimensional illumination pattern (31) onto an area of the surface of the target object, an image capture device (10) arranged to capture an image of the two-dimensional illumination pattern projected onto the area of the surface of the target object and a processor (25) configured to process the captured image in order to reconstruct a depth profile of the two-dimensional area of the surface of the target object from the image captured by the image capture device.
