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測定支援装置、測定支援方法、測定支援システム、及びプログラム
专利权人:
NECプラットフォームズ株式会社
发明人:
大石 章夫
申请号:
JP2014043930
公开号:
JP6072717B2
申请日:
2014.03.06
申请国别(地区):
JP
年份:
2017
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide a measurement support device, a measurement support method, a measurement support system, and a program, which are capable of positioning a measured portion at an appropriate position of a measurement apparatus with accuracy.SOLUTION: A measurement support device 1 of the present invention comprises an image acquisition unit 11, an image generation unit 12, and a display unit 13.The image acquisition unit 11 acquires an apparatus image including the measurement apparatus. The image generation unit 12 generates a superimposed image that is obtained by superimposing a guide image for guiding the measured portion to a measurement position on the measurement apparatus, with the apparatus image on the basis of the apparatus image. The display unit 13 displays the superimposed image.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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