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卵検査装置
专利权人:
株式会社ナベル
发明人:
藤谷 伸一,長谷川 貴之,鴫谷 瞳
申请号:
JP2012208335
公开号:
JP5967766B2
申请日:
2012.09.21
申请国别(地区):
JP
年份:
2016
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide an egg inspection apparatus capable of highly accurately and relatively inexpensively inspecting various types of states of eggs without being affected by structural factors of the eggs.SOLUTION: An egg inspection apparatus 10A according to the present invention includes: support parts 11 for supporting eggs 1 a temperature measuring section 20A consisting of three temperature sensors 20a, 20b, and 20c that move relative to an egg 1 supported by the support parts 11, contactlessly measure temperatures of predetermined areas of the egg 1, and output temperature data relating to the temperatures and an inspection section 21A that inspects a state of the egg 1 on the basis of a change generated by the relative movement of the temperature data output from the temperature measuring section 20A.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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