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EXAMINATION DIAGNOSIS DEVICE
专利权人:
发明人:
Takehito HANANOUCHI
申请号:
US15569473
公开号:
US20180085049A1
申请日:
2016.03.29
申请国别(地区):
US
年份:
2018
代理人:
摘要:
An examination diagnosis device includes a probe, a stress detector and a grip. The probe has an elongated portion and a tip portion, and the tip portion is provided to be bent at one end of the elongated portion. The stress detector is configured to be able to detect a force in an X direction, a force in a Y direction and a force in a Z direction applied to the tip portion of the probe. The tip portion of the probe may be bent in a plane parallel to the X direction and the Z direction. A user allows the tip portion of the probe to come into contact with a joint portion that is a subject of examination and diagnosis while gripping the grip.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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