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代表樣品的光的檢測和使用
专利权人:
ALENTIC MICROSCIENCE INC.
发明人:
FINE, Alan Marc,MACAULAY, Hershel,KREPLAK, Laurent
申请号:
HK16106945.5
公开号:
HK1218956A
申请日:
2016.06.16
申请国别(地区):
HK
年份:
2017
代理人:
摘要:
An imaging device includes light sensitive locations that are separately sensitive to light received at a surface with respect to a portion of a sample associated with the surface, the light sensitive locations having a resolution of 5 microns or smaller. There is a device to associate the portion of the sample with the surface. The imaging device and a distance of the portion of the sample to the light sensitive locations are such that usable useful image of the portion of the sample can be acquired directly by operation of the imaging device. An imaging device includes light sensitive sources that are separately able to deliver light with respect to a portion of a sample associated with the surface. The light source locations having a resolution of 5 microns or smaller. There is a device to associate the portion of the sample with the surface. The imaging device and a distance of the portion of the sample to the light source locations are such that a useful image of the portion of the sample can be acquired directly by operation of the imaging device. An imaging device can include both the light source locations and the light source locations and the light sensitive locations.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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