IMPLANT INSTALLATION STRENGTH EVALUATION METHOD, IMPLANT INSTALLATION STRENGTH EVALUATION DEVICE, AND PROGRAM

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专利权人:

KEIO UNIVERSITY;NATIONAL INSTITUTES FOR QUANTUM AND RADIOLOGICAL SCIENCE AND TECHNOLOGY

发明人:

Daisuke NAKASHIMA,Takeo NAGURA,Masaharu NISHIKINO,Noboru HASEGAWA,Katsuhiro MIKAMI,Toshiyuki KITAMURA,Shuji KONDO,Hajime OKADA,Yoshinori SHIMADA

申请号：

US16647069

公开号：

US20200205730A1

申请日:

2018.09.13

申请国别(地区):

US

年份:

2020

代理人:

摘要：

An implant installation strength evaluation method includes a step of vibrating an implant, a step of measuring time series data of the number of vibrations and vibration strengths of the implant vibrated in the vibrating step, and a step of deriving information indicating an index of an installation strength of the implant based on the time series data of the number of vibrations and vibration strengths of the implant.

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http://www.ckcest.cn/home/