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System and method for reconstructing the surface topography of an object embedded within a scattering medium
专利权人:
Visuray Intech Ltd (BVI)
发明人:
Spannuth Melissa,Ponce David,Voll Ådne,Torsteinsen Henning,Esmaeili Morteza,Gunn Spencer
申请号:
US201715810931
公开号:
US10132764(B2)
申请日:
2017.11.13
申请国别(地区):
美国
年份:
2018
代理人:
Ferrera Raymond R.`Adams and Reese LLP
摘要:
Methods of reconstructing the surface topography of an object embedded in a scattering medium are provided, with example methodologies including: imaging an object embedded in a signal scattering medium using a scattered signal detector; detecting changes in the magnitude of a plurality of scattered signals obtained from multiple fields of view within the medium; and constructing an image of the surface topography of the object based on said plurality of detected signal magnitude changes. A plurality of system, apparatus, control means, evaluation methods, and materials and components useful for practicing the methods are also disclosed.
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