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Nail gauge measuring nail shape and nail arc length
专利权人:
Kefei Wang;Yong Li;Yinhong Zhao
发明人:
Yong Li,Kefei Wang,Yinhong Zhao
申请号:
US13731179
公开号:
US09398797B2
申请日:
2012.12.31
申请国别(地区):
US
年份:
2016
代理人:
摘要:
A nail gauge tool is provided for quickly and accurately measuring nail shape and nail size. The nail gauge offers several arch-shaped openings for matching to and measuring a natural nail. As the measurement result, the nail arch shape information and nail arc length information along the natural nail's width direction are obtained for manufacturing custom-fit artificial nails. The nail gauge tool is advantageously small and suitable for use inside a nail salon.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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