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Magnetic resonance system with position-dependent slew rate limitation
专利权人:
Heiko Meyer
发明人:
Heiko Meyer
申请号:
US14592798
公开号:
US10036792B2
申请日:
2015.01.08
申请国别(地区):
US
年份:
2018
代理人:
摘要:
A control facility of a magnetic resonance system receives parameters of a measuring sequence from an operator. The parameters define an activation of a gradient system of the magnetic resonance system. The control facility detects an exposure of at least one body region of the examination object brought about by the activation of the gradient system. The exposure is detected as a function of the position in which the examination object is disposed in an examination volume of the magnetic resonance system.
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中国工程科技知识中心
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