您的位置: 首页 > 农业专利 > 详情页

Management system for skin condition measurement analysis information and management method for skin condition measurement analysis information
专利权人:
LTD.;HITACHI MAXELL
发明人:
Fumie Kusumoto,Masashi Yoshimura,Eiji Sakata,Hironobu Nagano,Kenji Matsuoka,Kengo Miura
申请号:
US14379086
公开号:
US09779167B2
申请日:
2013.02.15
申请国别(地区):
US
年份:
2017
代理人:
摘要:
Service can be offered free of charge and the cost of a skin condition measuring device can be reduced by effectively using data on the occasion of obtaining an analysis result by transmitting measurement data by the skin condition measuring device to a server of a company providing a service of analyzing the measurement data. When a request is made from a contractor client to acquire data registered in a measurement data database, authentication is executed based on a contractor ID input from the contractor client. Additionally, when the measurement data database is searched from a contractor database based on the contractor ID, a search level and an access level are obtained. The contractor client is permitted to search the measurement data database within a range of the search level and the access level.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充