METHOD OF ESTIMATION OF THICKNESS OF THIN POLYMER FILMS

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专利权人:

federalnoe gosudarstvennoe byudzhetnoe obrazovatelnoe uchrezhdenie vysshego obrazovaniya "Rossijskij gosudarstvennyj pedagogicheskij universitet im. A.I. Gertsena" (RGPU im. A.I. Gertsena)

发明人:

Kastro Arata Rene Alekhandro,Kononov Aleksej Andreevich

申请号：

RU20170137569

公开号：

RU2672820(C1)

申请日:

2017.10.26

申请国别(地区):

俄罗斯

年份:

2018

代理人:

摘要：

FIELD: measurement technology.SUBSTANCE: use to determine the thickness of films of polymer composites. Essence of the invention lies in the fact that the method for estimating the thickness of thin polymer films is carried out by analyzing the dielectric characteristics of the samples and their dependences on the thickness using a linear dependence of the temperature of the conductivity change on the thickness of the FDP films (the temperature at which the dielectric conductivity varies with the thickness of the polymer film).EFFECT: providing the possibility of estimating the thickness of polymer films by the temperature of the transition of the polymer composite to a conducting state.1 cl, 3 dwg

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中国工程科技知识中心

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