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放射線画像解析装置および方法並びにプログラム
专利权人:
富士フイルム株式会社
发明人:
榎本 淳,田島 崇史,小石 毅,中津川 晴康,澤田 浩史,原田 泰樹,川村 隆浩,内藤 慧,山岸 栄輝,位田 憲昭,小田 泰史,桑原 健,細井 雄一,西納 直行
申请号:
JP2014156616
公开号:
JP6129125B2
申请日:
2014.07.31
申请国别(地区):
JP
年份:
2017
代理人:
摘要:
PROBLEM TO BE SOLVED: To acquire information for correcting an error in a body thickness distribution of a subject image representing a subject with influence of scattered radiation generated due to an imaging environment in a predetermined imaging environment in an image analysis device, method and program.SOLUTION: A radiation image analysis device comprises: an image acquisition section 33 which acquires a reference image being a radiation image captured without arranging a subject in a predetermined imaging environment and a correction distribution acquisition section 35 which estimates the body thickness distribution of a virtual subject of the reference image on the basis of a scattered radiation component included in the reference image by considering that the scattered radiation component included in the acquired reference image is generated by the virtual subject representing an imaging environment of the reference image, and acquires the estimated body thickness distribution of the virtual subject as a correction distribution of the reference image being a distribution of a body thickness correction amount for correcting the error in the body thickness distribution of the subject image being a radiation image captured with a desired subject arranged in the imaging environment.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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